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Rietveld Refinement in the Characterization of Crystalline Materials

Rietveld Refinement in the Characterization of Crystalline Materials

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This Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.

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Keywords

  • Crystalline materials
  • functional materials
  • Microstructural analysis
  • Rietveld method
  • Structural characterization
  • Structural materials
  • X-ray and neutron diffraction

Links

DOI: 10.3390/books978-3-03897-528-1

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