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Using Fine Grain Approaches for Highly Reliable Design of FPGA-based Systems in Space
Mahtab Niknahad
2013
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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.
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Keywords
- FPGA
- High reliability
- Redundancy
- single event upset
- Space
Links
DOI: 10.5445/KSP/1000035134Editions