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Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution

Microplasticity of idealized single crystalline Ag cantilevers characterized with methods of high resolution

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Single crystalline, µm-sized cantilevers are fabricated out of epitaxially grown Ag thin films by a lithography-based procedure and are deflected by a nanoindenter system. The microstructure of the plastically deformed cantile-vers is investigated using transmission Kikuchi diffraction (TKD) on the cantilever cross section. 3D discrete dislocation dynamics simulations (DDD) are performed for further analysis. A mechanism to explain the formation of dislocation networks upon loading is suggested.

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DOI: 10.5445/KSP/1000070130

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