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Radiation Tolerant Electronics

Radiation Tolerant Electronics

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Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.

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Keywords

  • 4MR
  • analog single-event transient (ASET)
  • bandgap voltage reference (BGR)
  • bipolar transistor
  • CMOS
  • CMOS analog integrated circuits
  • Co-60 gamma radiation
  • configuration memory
  • Digital integrated circuits
  • error rates
  • Fault tolerance
  • FMR
  • FPGA
  • FPGA-based digital controller
  • frequency divider by two
  • Frequency synthesizers
  • gain degradation
  • gamma ray
  • gamma-rays
  • hardening by design
  • heavy ions
  • heavy-ions
  • History of engineering & technology
  • Image processing
  • Impulse Sensitive Function
  • instrumentation amplifier
  • ionization
  • line buffer
  • n/a
  • neutron irradiation effects
  • nuclear fusion
  • physical unclonable function
  • PLL
  • power MOSFETs
  • proton irradiation
  • proton irradiation effects
  • protons
  • radiation effects
  • radiation hardening
  • radiation hardening by design
  • radiation hardening by design (RHBD)
  • radiation tolerant
  • radiation-hardened
  • radiation-hardening-by-design (RHBD)
  • reference circuits
  • RFIC
  • ring oscillator
  • Ring Oscillators
  • ring-oscillator
  • saturation effect
  • SEB
  • SEE testing
  • selective hardening
  • sensor readout IC
  • single event effects
  • single event gate rupture (SEGR)
  • single event opset (SEU)
  • single event transient (SET)
  • single event upset
  • single event upset (SEU)
  • single event upsets
  • single-event effects (SEE)
  • single-event upsets (SEUs)
  • single-shot
  • soft error
  • soft errors
  • space application
  • space electronics
  • SRAM-based FPGA
  • TDC
  • Technology, engineering, agriculture
  • Technology: general issues
  • TMR
  • total ionization dose (TID)
  • total ionizing dose
  • total ionizing dose (TID)
  • triple modular redundancy (TMR)
  • triplex–duplex
  • VHDL
  • voltage controlled oscillator (VCO)
  • voltage reference
  • X-rays

Links

DOI: 10.3390/books978-3-03921-280-4

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