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Breitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik

Breitbandige Frequenzweichen für die Parallelisierung von Millimeterwellen-Messtechnik

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This work describes the novel use of broadband continuous diplexers that could be integrated into on-wafer probes to parallize millimeter wave on-wafer measurement equipment. A model-based method for the efficient design of diplexers with a large number of adjustable parameters allows the realization of a DC – 110 GHz – 170 GHz diplexer for the first time.

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DOI: 10.5445/KSP/1000128278

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