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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
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This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
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- 6 - pdf (CC BY) at mts.intechopen.com.
Keywords
- Condensed matter physics (liquid state & solid state physics)
- Materials / States of matter
- Mathematics & science
- Physics
- thema EDItEUR::P Mathematics and Science::PH Physics::PHF Materials / States of matter::PHFC Condensed matter physics (liquid state and solid state physics)
Links
DOI: 10.5772/intechopen.94185Editions