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Recent Advances in Thin Film Electronic Devices

Recent Advances in Thin Film Electronic Devices

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This reprint is a collection of the papers from the Special Issue “Recent Advances in Thin Film Electronic Devices” in Micromachines. In this reprrint, 1 editorial and 11 original papers about recent advances in the research and development of thin film electronic devices are included. Specifically, three research fields are covered: device fundamentals (5 papers), fabrication processes (5 papers), and testing methods (1 paper). The experimental data, simulation results, and theoretical analysis presented in this reprint should benefit those researchers in flat panel displays, flat panel sensors, energy devices, memories, and so on.

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Keywords

  • a-IGZO TFTs
  • active layer
  • amorphous InGaZnO (a-IGZO)
  • annealing
  • annealing atmosphere
  • area charge-coupled device
  • artificial synapse
  • band-to-band tunneling
  • color filter
  • dielectric
  • Economics, finance, business & management
  • electrodeposition
  • Energy industries & utilities
  • epitaxial growth
  • Flexible electronics
  • foreign material
  • gate-all-around (GAA)
  • gate-all-around field-effect-transistors (GAA FETs)
  • ground plane region
  • halide perovskite
  • History of engineering & technology
  • hot-carrier injection (HCI)
  • hybrid structure
  • Industry & industrial studies
  • ITO
  • laser sensor
  • laser treatment
  • lift-off
  • logic transistors
  • long-term synaptic plasticity
  • metal oxide semiconductor thin film transistor
  • Morphology
  • multilayer conductive films
  • n/a
  • nanosheet FETs (NS FETs)
  • nitrogen-doping
  • Numerical Simulation
  • oxygen vacancy
  • parasitic channel leakage
  • photonic crystal fiber
  • plasmonic sensor
  • polarization filter
  • positive bias stress (PBS)
  • power consumption
  • punch-through
  • Reliability
  • schottky barrier diodes
  • semiconductor defects
  • shape-memory polymer
  • short-term synaptic plasticity
  • Silver
  • solution method
  • solution-processing electronics
  • Stability
  • sub-gap states
  • surface plasmon resonance
  • Technology, engineering, agriculture
  • Technology: general issues
  • Thin films
  • thin-film transistor
  • thin-film transistor (TFT)
  • TiO2
  • Wearable electronics
  • wrinkling
  • zinc oxide films

Links

DOI: 10.3390/books978-3-0365-5293-4

Editions

edition cover

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