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Single-Event Effects, from Space to Accelerator Environments
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This book describes the fundamental concepts of particle interaction physics and electronics hardening design for harsh environments.
This book is included in DOAB.
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Keywords
- Radiation Effects on Integrated Circuits and Systems
- radiation hardening by design
- Radiation Hardening by Process
- RADSAGA
- Single Event Effects in Aerospace
- Soft Errors from Particle to Circuits
Links
DOI: 10.1007/978-3-031-71723-9web: https://link.springer.com/book/10.1007/978-3-031-71723-9
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