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OCM 2021 - Optical Characterization of Materials

Jürgen Beyerer and Thomas Längle, editors

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OCM 2021 - Optical Characterization of Materials

Jürgen Beyerer and Thomas Längle, editors

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Materialklassifikation in optischen Inspektionssystemen mithilfe hyperspektraler Daten

Michelsburg, Matthias

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Materialklassifikation in optischen Inspektionssystemen mithilfe hyperspektraler Daten

Michelsburg, Matthias

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